Labratory
Production
Opacity/Haze
Thickness Measurement
Process Control
Analysis
Miscellaneous
The Inspection System FIS 1000 nonwoven is especially optimized for defect recognition in nonwoven. With this absolutly reliable and high efficient inspections system surface defects can be recognized in a range of 50mm up to 10m material width. FIS 1000 non woven detects, classifies, documents and records optical defects at films. For illumination is possible LED line lamps for reflected light, transmitted light and light or dark field. The defects are automatically classified such as enclosures, burning particles, eyebrowns, wrinkles, think areas, holes dirt, etc.. Picture of the defects can be shown later on with RAM_PAT. It is possible to defined as much classifiers (size and type) as you want. This “High End System” is able to differ any defect explicitly. Users can typecast Defects only by using their pictures and sort then by classes. The classificator will automatically calculate all parameter for this free learned defect class. The system can also handle several slits, also with different widths, and assign them different order numbers. . | ||||||||||||||||||||
Technical Data
FIS 1000Nonwoven
|
© Copyright 2015 R.A.M. Realtime Application Measurement GmbH | +49 (0) 6145 / 9356-0